- 您现在的位置：买卖IC网 > Sheet目录983 > HI5767EVAL1 (Intersil)EVALUATION PLATFORM HI5767
Application Note 9822
The data corresponding to a particular analog input sample
will be available at the digital outputs of the HI5767 after the
data latency (7 cycles) plus the HI5767 digital data output
delay.
The sample clock and digital output data signals are made
available through two connectors contained on the evaluation
board. Line drivers are not provided for the digital output data
and it should be pointed out that the load presented to the
converter digital output data signals, D0 - D9, should not
exceed the data sheet CMOS drive limits and a load
capacitance of 10pF. The P1 96-pin I/O connector allows the
evaluation board to be interfaced to the DSP evaluation
boards available from Intersil. The digital output data and
sample clock can also be accessed by clipping the test leads
of a logic analyzer or data acquisition system onto the
header/connector pins of connector P2.
The A/D converters OE control input pin allows the digital
output data bus of the converter to be switched to a three-
state high impedance mode. This feature enables the
testing and debugging of systems which are utilizing one or
more converters. This three-state control signal is not
intended for use as an enable/disable function on a
common data bus and could result in possible bus
the analog input signal. The comparator on the evaluation
board will convert the sine wave CLK input signal to a
square wave at TTL logic levels to drive the sample clock
input of the HI5767. The ADC data is captured by a logic
analyzer and then transferred over the GPIB bus to the PC.
The PC has the required software to perform the Fast
Fourier Transform (FFT) and do the data analysis.
Coherent testing is recommended in order to avoid the
inaccuracies of windowing. The sampling frequency and
analog input frequency have the following relationship:
F I /F S = M/N, where F I is the frequency of the input analog
sinusoid, F S is the sampling frequency, N is the number of
samples, and M is the number of cycles over which the
samples are taken. By making M an integer and odd
number (1, 3, 5, ...) the samples are assured of being
nonrepetitive.
Refer to the HI5767 data sheet for a complete list of test
de?nitions and the results that can be expected using the
evaluation board with the test setup shown. Evaluating the
part with a reconstruction DAC is only suggested when
doing bandwidth or video testing.
contention issues. The A/D converters OE control input pin
is controlled by the installation or removal of a shunt, JP1,
contained on the evaluation board. Installation of JP1
forces the OE control input pin low for normal operation
HP8662A
REF
HP8662A
BANDPASS
FILTER
while removal of JP1 allows the digital output data bus of
the converter to be switched to a three-state high
impedance mode.
HI5767 Performance Characterization
CLK
COMPARATOR
V IN
V IN
EVALUATION BOARD
Dynamic testing is used to evaluate the performance of the
HI5767 A/D converter. Among the tests performed are
Signal-to-Noise and Distortion Ratio (SINAD), Signal-to-
Noise Ratio (SNR), Total Harmonic Distortion (THD),
Spurious Free Dynamic Range (SFDR) and InterModulation
Distortion (IMD).
Figure 4 shows the test system used to perform dynamic
testing on high-speed ADCs at Intersil. The clock (CLK)
and analog input (V IN ) signals are sourced from low phase
noise HP8662A synthesized signal generators that are
phase locked to each other to ensure coherence. The
output of the signal generator driving the ADC analog input
is bandpass filtered to improve the harmonic distortion of
3-4
CLK HI5767
DIGITAL DATA OUTPUT
HI5767EVAL1
14
DAS9200
GPIB
PC
FIGURE 3. HIGH-SPEED A/D PERFORMANCE TEST SYSTEM
发布紧急采购，3分钟左右您将得到回复。
相关PDF资料
HI5767EVAL2
EVALUATION PLATFORM HI5767
HI5805EVAL1
EVALUATION PLATFORM HI5805
HI5828EVAL2
EVALUATION PLATFORM HI5828
HI5960SOICEVAL1
EVALUATION PLATFORM SOIC HI5960
HI7188EVAL
EVALUATION PLATFORM HI7188
HI7190EVAL
EVALUATION PLATFORM HI7190
HJ4-L-DC12V
RELAY GEN PURPOSE 4PDT 5A 12V
HL2-HP-AC100V-F
RELAY GEN PURPOSE DPDT 10A 100V
相关代理商/技术参数
HI5767EVAL2
功能描述:数据转换 IC 开发工具 HI5767 HI FREQUENCY EVALUATION PLATFORM
RoHS:否 制造商:Texas Instruments 产品:Demonstration Kits 类型:ADC 工具用于评估:ADS130E08 接口类型:SPI 工作电源电压:- 6 V to + 6 V
HI5780
制造商:INTERSIL 制造商全称:Intersil Corporation 功能描述:10-Bit, 80 MSPS, High Speed, Low Power D/A Converter
HI5780-EV
制造商:INTERSIL 制造商全称:Intersil Corporation 功能描述:10-Bit, 80 MSPS, High Speed, Low Power D/A Converter
HI5780JCQ
制造商:Rochester Electronics LLC 功能描述:32 PQFP COMTEMP VIDEO D/A 10BIT 80MHZ - Bulk 制造商:Harris Corporation 功能描述:
HI5780JCQ-T
制造商:Rochester Electronics LLC 功能描述:HI5780JCQ IN TAPE & REEL - Bulk
HI5800
制造商:INTERSIL 制造商全称:Intersil Corporation 功能描述:12-Bit, 3MSPS, Sampling A/D Converter
HI5800_00
制造商:INTERSIL 制造商全称:Intersil Corporation 功能描述:12-Bit, 3MSPS, Sampling A/D Converter
HI5800BID
制造商:INTERSIL 制造商全称:Intersil Corporation 功能描述:12-Bit, 3MSPS, Sampling A/D Converter